Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometry
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| Abstract |
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| Year of Publication |
2021
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| Date Published |
2021-01
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| Journal Title |
Science Advances
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| Volume |
7
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| Issue |
5
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| Start Page or Article ID |
eabd9667
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| DOI | |
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| Download citation | |
| JILA PI | |
Journal Article
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