Wang B., N. Brooks, P. Johnsen, N.W. Jenkins, Y. Esashi, I. Binnie, M. Tanksalvala, H. Kapteyn, and M. Murnane, Submitted (2023).
Michael Tanksalvala
First name
Michael
Last name
Tanksalvala
Carlson D., M. Tanksalvala, D. Morrill, J. San Román, E.C. Jarque, H. Kapteyn, M. Murnane, and M. Hemmer, Optica 47, 5289-5292 (2022).
Jacobs M., Y. Esashi, N.W. Jenkins, N. Brooks, H. Kapteyn, M. Murnane, and M. Tanksalvala, Optics Express 30, 27967 (2022).
Brooks N., B. Wang, I. Binnie, M. Tanksalvala, Y. Esashi, J.L. Knobloch, Q.L. Nguyen, B. McBennett, N.W. Jenkins, G. Gui, and Z.Z.T. University, Optics Express 30, 30331 (2022).
Esashi Y., M. Tanksalvala, Z. Zhang, N.W. Jenkins, H. Kapteyn, and M. Murnane, Osa Continuum 4, 1497 (2021).
Wang B., M. Tanksalvala, Z. Zhang, Y. Esashi, N.W. Jenkins, M. Murnane, H. Kapteyn, and C.-T. Liao, Metrology, Inspection, And Process Control For Semiconductor Manufacturing Xxxv 11611, 76-90 (2021).
Tanksalvala M., C.L. Porter, Y. Esashi, B. Wang, N.W. Jenkins, Z. Zhang, G.P. Miley, J.L. Knobloch, B. McBennett, N. Horiguchi, and S. Yazdi, Science Advances 7, eabd9667 (2021).
Wang B., M. Tanksalvala, Z. Zhang, Y. Esashi, N.W. Jenkins, M. Murnane, H. Kapteyn, and C.-T. Liao, Optics Express 29, 3342 (2021).
Bevis C.S., R.M. Karl, J. Reichanadter, D. Gardner, C.L. Porter, E. Shanblatt, M. Tanksalvala, G.F. Mancini, H. Kapteyn, M. Murnane, and D. Adams, Ultramicroscopy 184, 164-171 (2018).
Mancini G.F., R.M. Karl, E. Shanblatt, C.S. Bevis, D. Gardner, M. Tanksalvala, J.L. Russell, D.E. Adams, H. Kapteyn, J.V. Badding, and T.E. Mallouk, Optics Express 26, 11393 (2018).