1 Y.. Esashi, N.W. Jenkins, Y.. Shao, J.M. Shaw, S.. Park, M.. Murnane, H.. Kapteyn, and M.. Tanksalvala, Review of Scientific Instruments 94, (2023).
Michael Tanksalvala
First name
Michael
Last name
Tanksalvala
1 B.. Wang, N.J. Brooks, P.. Johnsen, N.W. Jenkins, Y.. Esashi, I.. Binnie, M.. Tanksalvala, H.. Kapteyn, and M.. Murnane, Optica 10, (2023).
1 Y.. Esashi, N.W. Jenkins, Y.. Shao, J.M. Shaw, S.. Park, M.. Murnane, H.. Kapteyn, and M.. Tanksalvala, Review of Scientific Instruments (In Press) (2023).
1 B.. Wang, N.. Brooks, P.. Johnsen, N.W. Jenkins, Y.. Esashi, I.. Binnie, M.. Tanksalvala, H.. Kapteyn, and M.. Murnane, Optics & Photonics News (In Press) (2023).
1 D.. Carlson, M.. Tanksalvala, D.. Morrill, J.. San Román, E.C. Jarque, H.. Kapteyn, M.. Murnane, and M.. Hemmer, Optica 47, (2022).
1 M.. Jacobs, Y.. Esashi, N.W. Jenkins, N.. Brooks, H.. Kapteyn, M.. Murnane, and M.. Tanksalvala, Optics Express 30, (2022).
1 N.. Brooks, B.. Wang, I.. Binnie, M.. Tanksalvala, Y.. Esashi, J.L. Knobloch, Q.L. Nguyen, B.. McBennett, N.W. Jenkins, G.. Gui, Z.Z.T. University, H.. Kapteyn, M.. Murnane, and C.S. Bevis, Optics Express 30, (2022).
1 Y.. Esashi, M.. Tanksalvala, Z.. Zhang, N.W. Jenkins, H.. Kapteyn, and M.. Murnane, OSA Continuum 4, (2021).
1 B.. Wang, M.. Tanksalvala, Z.. Zhang, Y.. Esashi, N.W. Jenkins, M.. Murnane, H.. Kapteyn, and C.-T.. Liao, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV 11611, (2021).
1 M.. Tanksalvala, C.L. Porter, Y.. Esashi, B.. Wang, N.W. Jenkins, Z.. Zhang, G.P. Miley, J.L. Knobloch, B.. McBennett, N.. Horiguchi, S.. Yazdi, J.. Zhou, M.. Jacobs, C.S. Bevis, R.M. Karl, P.. Johnsen, D.. Ren, L.. Waller, D.E. Adams, S.. Cousin, C.-T.. Liao, J.. Miao, M.. Gerrity, H.. Kapteyn, and M.. Murnane, Science Advances 7, (2021).