Analysis of trace impurities in semiconductor gas via~cavity-enhanced direct frequency comb spectroscopy | JILA

Author	Kevin Cossel F. Adler K. Bertness M. Thorpe J. Feng M. Raynor Jun Ye
Year of Publication	2010
Date Published	2010-09
Journal Title	Applied Physics B
Volume	100
Start Page or Article ID (correct)	917-924
ISSN Number	0946-2171
PDF	sArticle_2010_07_CosselGasComb.pdf2.04 MB
DOI	10.1007/s00340-010-4132-5
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JILA PI	Jun Ye
	Journal Article
JILA Topics	Precision Measurement
Publication Status	Published