Analysis of trace impurities in semiconductor gas via~cavity-enhanced direct frequency comb spectroscopy
| Author | |
|---|---|
| Year of Publication |
2010
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| Date Published |
2010-09
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| Journal Title |
Applied Physics B
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| Volume |
100
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| Start Page or Article ID |
917-924
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| ISSN Number |
0946-2171
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| DOI | |
| Download citation | |
| JILA PI | |
Journal Article
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| JILA Topics | |
| Publication Status |