TY - JOUR
AU - Kevin Cossel
AU - F. Adler
AU - K. Bertness
AU - M. Thorpe
AU - J. Feng
AU - M. Raynor
AU - Jun Ye
BT - Applied Physics B
DA - 2010-09
DO - 10.1007/s00340-010-4132-5
PY - 2010
SP - 917
EP - 924
T2 - Applied Physics B
TI - Analysis of trace impurities in semiconductor gas via~cavity-enhanced direct frequency comb spectroscopy
VL - 100
SN - 0946-2171
ER -