Atomic force microscopy study of the growth and annealing of Ge islands on Si(100)

Author
Year of Publication
2002
Date Published
Jan-01-2002
Journal Title
Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures
Volume
20
Start Page or Article ID (correct)
678
ISSN Number
0734211X
DOI
Download citation
JILA PI
Journal Article
Publication Status