TY - JOUR
AU - Bing Liu
AU - C. Berrie
AU - Takeshi Kitajima
AU - John Bright
AU - Stephen Leone
BT - Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures
DA - Jan-01-2002
DO - 10.1116/1.1459724
PY - 2002
EP - 678
T2 - Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures
TI - Atomic force microscopy study of the growth and annealing of Ge islands on Si(100)
VL - 20
SN - 0734211X
ER -