Henry Kapteyn

Dorney K.M., T. Fan, Q.L. Nguyen, J.L. Ellis, D.D. Hickstein, N. Brooks, D. Zusin, C. Gentry, C. Hernández-García, H. Kapteyn, and M. Murnane, Optics Express 29, 38119 (2021).

Beardo A., J.L. Knobloch, L. Sendra, J. Bafaluy, T.D. Frazer, W. Chao, J. Hernandez-Charpak, H. Kapteyn, B. Abad, M. Murnane, and X. Alvarez, Acs Nano (2021).

Esashi Y., M. Tanksalvala, Z. Zhang, N.W. Jenkins, H. Kapteyn, and M. Murnane, Osa Continuum 4, 1497 (2021).

Lo Y.H., J. Zhou, A. Rana, D. Morrill, C. Gentry, B. Enders, Y.-S. Yu, C.-Y. Sun, D. Shapiro, R.W. Falcone, and H. Kapteyn, Proceedings Of The National Academy Of Sciences 118, e2019068118 (2021).

Slaughter D.S., F. Sturm, R.Y. Bello, K.A. Larsen, N. Shivaram, C.W. McCurdy, R. Lucchese, L. Martin, C.W. Hogle, M. Murnane, and H. Kapteyn, Physical Review Research 3, 033191 (2021).

Lloyd-Hughes J., P. Oppeneer, T. Santos, A. Schleife, S. Meng, M. Sentef, M. Ruggenthaler, A. Rubio, I. Radu, M. Murnane, and X. Shi, Journal Of Physics: Condensed Matter 33, in press (2021).

Wang B., M. Tanksalvala, Z. Zhang, Y. Esashi, N.W. Jenkins, M. Murnane, H. Kapteyn, and C.-T. Liao, Metrology, Inspection, And Process Control For Semiconductor Manufacturing Xxxv 11611, 76-90 (2021).

Holzmeier F., K.M. Dorney, E.W. Larsen, T. Nuytten, D.P. Singh, M. van Setten, P. Vanelderen, C. Bargsten, S.L. Cousin, D. Raymondson, and E. Rinard, Novel Patterning Technologies 2021 11610, 1161010 (2021).

Couch D.E., M. Murnane, D.D. Hickstein, and H. Kapteyn, Optics And Photonics News 31, 34 (2020).

Tanksalvala M., C.L. Porter, Y. Esashi, B. Wang, N.W. Jenkins, Z. Zhang, G.P. Miley, J.L. Knobloch, B. McBennett, N. Horiguchi, and S. Yazdi, Science Advances 7, eabd9667 (2021).