Si/SiO2 interface roughness: Comparison between surface second harmonic generation and x-ray scattering
| Author | |
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| Year of Publication |
1997
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| Date Published |
Jan-01-1997
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| Journal Title |
Applied Physics Letters
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| Volume |
70
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| Start Page or Article ID |
1414
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| ISSN Number |
00036951
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| DOI | |
| URL | |
| Download citation | |
| JILA PI | |
Journal Article
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| Publication Status |