Back-scattered detection provides atomic-scale localization precision, stability, and registration in 3D
| Author | |
|---|---|
| Year of Publication |
2007
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| Date Published |
2007-10
|
| Journal Title |
Optics Express
|
| Volume |
15
|
| Start Page or Article ID |
13434
|
| DOI | |
| Download citation | |
| JILA PI | |
| Associated Institutes | |
Journal Article
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| Publication Status |


