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Measurement of the Excited-State Lifetime of a Microelectronic Circuit

TitleMeasurement of the Excited-State Lifetime of a Microelectronic Circuit
Publication TypeJournal Article
Year of Publication2003
AuthorsLehnert, KW, Bladh, K, Spietz, L, Gunnarsson, D, Schuster, D, Delsing, P, Schoelkopf, RJ
JournalPhysical Review Letters
Volume90
Issue2
Date PublishedJan-01-2003
ISSN0031-9007
URLhttp://link.aps.org/doi/10.1103/PhysRevLett.90.027002
DOI10.1103/PhysRevLett.90.027002
Short TitlePhys. Rev. Lett.