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Measurement of the Excited-State Lifetime of a Microelectronic Circuit

TitleMeasurement of the Excited-State Lifetime of a Microelectronic Circuit
Publication TypeJournal Article
Year of Publication2003
AuthorsLehnert, KW, Bladh, K, Spietz, L, Gunnarsson, D, Schuster, D, Delsing, P, Schoelkopf, RJ
JournalPhysical Review Letters
Volume90
Date Published1/2003
ISSN0031-9007
DOI10.1103/PhysRevLett.90.027002