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Profiling of cross-sectional a-Si:H solar cells using a scanning tunneling microscope

TitleProfiling of cross-sectional a-Si:H solar cells using a scanning tunneling microscope
Publication TypeConference Paper
Year of Publication1999
AuthorsBarzen, S, Gallagher, AC
Conference NameNational center for photovoltaics (NCPV) 15th program review meetingAIP Conference Proceedings
PublisherAIP
Conference LocationDenver, Colorado (USA)
DOI10.1063/1.57975

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