Christina Porter has won the 2017 Karel Urbanek Best Student Paper Award. The award consists of a wall plaque, honorarium, and trophy. The award was presented on Thursday March 2, 2017, at this year's Metrology, Inspection, and Process Control for Microlithography conference at the SPIE Advanced LIthography in San Jose, California. The award is sponsored by KLA-Tencor.
Porter's paper was entitled "Sub-wavelength transmission and reflection-mode tabletop imaging with 13-nm illumination via ptychography CDI." The paper was judged along with Porter's oral presentation to earn her the prestigious award. Porter was co-first author with Michael Tanksalvala on the winning paper. Additional authors included Dennis F. Gardner, Michael Gerrity, Giulia F. Mancini, Xiaoshi Zhang, Galen P. Miley, Elisabeth R. Shanblatt, Benjamin R. Galloway, Charles S. Bevis, Robert Karl, Jr., Daniel A. Adams, Henry C. Kapteyn, and Margaret M. Murnane.
The Karel Urbanek Best Student Paper award recognizes the most promising contribution to the field by a student. The award is based on the technical merit and persuasiveness of the paper presented at the conference.