TY - ECHAP
AU - Stephen Leone
CY - Hoboken, NJ, USA
DO - 10.1002/9780470142745.ch4
PB - John Wiley \& Sons, Inc.
PP - Hoboken, NJ, USA
PY - 1982
SN - 9780471100591
SP - 255
EP - 324
TI - Photofragment Dynamics
VL - 50
ER -