@conference{6703,
  author = {W. Schade and D. Osborn and J. Preusser and Stephen Leone},
  title = {Spectroscopic characterization of semiconductor surface impurities by near-field scanning optical microscopy},
  year = {1998},
  publisher = {Optical Society of America , Washington, DC},
  note = {JILA Pub. 6014},
}